#43 | Impact Analysis of KPI Scenarios, Automated Best Practices Identification, and Deviations on Manufacturing Processes
Components
Imagem
Logo_augmanity

 

PPS 2  – Big Data and Predictive Analytics for i4.0

2022 “Impact Analysis of KPI Scenarios, Automated Best Practices Identification, and Deviations on Manufacturing Processes”

Autores: M.J. Lopes, E.M. Rocha.

Conferência: ETFA 2022 - 27th Annual Conference of the IEEE Industrial Electronics Society (IES), September 6-9, Stuttgart, Germany.

ETFA22_KPI_Scenarios_final.pdf